FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)
Brand : JEOL
Model : JSM-7800F
| Details | |
| Details of Instrument | FE-SEM is an essential tool to observe the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution, collect large area EBSD maps at low magnifications without distortion, perform low kV imaging and analysis of highly magnetic samples and image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector. |
| Sample Image |  |
| Service Charge | FESEM Fee per sample :-
EDS/EBSD/EDX Fee per sample :-
|
| Operation Hours | 9.00 a.m. – 4.30 p.m. |
| Status | Available for Booking |
| P.I.C |
-(For Booking)
microscopylaboratorymjiit@gmail.com
03-2203 1527
|
