Atomic Force Microscope




Brand : Bruker
Model : Multimode 8
 Details of Instrument Atomic force microscopy uses imaging technique with high resolution for measuring the surface topography by scanning with small probe with sharp tip across the sample. Characterization of electrical, magnetic, and mechanical properties can be done into nanoscale level using this instrument. 
Sample Image
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Atomic Force Microscope Fee per hour :-

  • Student/Staff MJIIT (RM80)
  • Student/Staff UTM (RM150)
  • Student/Staff Other University (RM200)
  • Industry (RM300)
 Operation Hours  9.00 a.m. – 4.30 p.m.
 Status  Available for Booking
-(For Booking)
03-2203 1527
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