LOW VACUUM SCANNING ELECTRON MICROSCOPE (LV-SEM)
Brand : JEOL
Model : JSM-IT300
Details | |
Details of Instrument | The JEOL JSM-IT300 is a high-performance, multi-purpose SEM capable of handling a variety of applications. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV. With a high resolution of 3.0nm at 30kV and unsurpassed low kV performance, the JSM-IT300LV delivers amazing clarity for imaging the finest structures. Versatility and high resolution across the magnification range of 5X – 300,000X. |
Service Charge | LVSEM Fee per sample :-
EDS Fee per sample :-
EDX Fee per sample :-
|
Operation Hours | 9.00 a.m. – 4.30 p.m. |
Status | Available for Booking |
P.I.C |
-(For Booking)
microscopylaboratorymjiit@gmail.com
03-2203 1527
|