Academic Staff : Kuwano

• Phase transformation and microstructure control
• Crystal growth process and defect control in compound semiconductors
• Micro-characterization by electron microscopy
• Kinetics of evolution in microstructure

• Fellow of Japanese Society of Applied Physics

• Research Project, Grant-in-Aid for Scientific Research, JSPS Japan (Project-Leader)        “Quantitative analysis of SEM image contrast considering diffraction effects and challenge to nano-structure characterization”. (2009-2011)
• Research Project, Grant-in-Aid for Scientific Research, JSPS, Japan (Project-Leader) “Development of characterization and analysis methods of nano-structure of nitride semiconductor crystals”(2007-2008)
• Research Project, Grant-in-Aid for Scientific Research, JSPS, Japan (Project-Leader) “Nano-analysis of occupation sites of impurity atoms and relation with functional characteristics” (2005-2007)

• 2012, Adjunct Professor of The Research Laboratory fro High Voltage Electron Microscopy, Kyushu University.
• 2003, Professor of Art, Science and Technology Center for Cooperative Research, Kyushu University.
• 1999 Professor of Advanced Science and Technology Center for Coopeartive Research, Kyushu University

• 2012- up to date; Member of International Advisory Board of 5th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2013)
• 2009-2010:  Director of Kyushu Branch, Japanese Society of Microscopy
• 2007- up to date: Executive Editor of Journal of Electron Microscopy (Oxford University Press) Japanese Society of Microscopy
• 2007-2008:  Director of Kyushu Branch, Japan Institute of Metals.

• 2007-2008:　Member of the Board of Directors, Japanese Society of Microscopy

• 1999-2010: Executive Editor; Japanese Journal of Applied Physics.
• Member of Steering/Program Committees of a variety of International Conferences

• 2011 International Metallographic Contest  First Place  (International Metallographic Society), Class 4: Electron Microscopy-Scanning, “Analysis of self-accommodated structures of B19’ martensite in Ti-Ni alloys using reverse transformation relief” (2011).
• Metallographic Award  (Japan Institute of Metals), “Observation of self-accommodated structures of B19’ TiNi martensite using the reverse transformation relief” (2011).
• Fellow Award (Japan Society of Applied Physics), “Study of dislocation behavior in semiconductors by means of electron microscopy”, (2010)

• Takaaki Kuwahara, Noriyuki Kuwano, Akihiko Kurisu, Narihito Okada and Kazuyuki Tadatomo, Behavior of misfit dislocations in semipolar InGaN/GaN grown by MOVPE, Physical. Status Solidi., Vol. C9, No.3-4, 2012, 488-491.
• Reina Miyagawa, Shibo Yang, Hideto Miyake, Kazumasa Hiramatsu, Takaaki Kuwahara, Masatoshi Mitsuhara and Noriyuki Kuwano, Applied Physics Express, Vol. 5, 2012, 025501.1-3.
• Yoshihiko Kangawa, Noriyuki Kuwano, Boris M. Epelbaum and Koichi Kakimoto, Microstructure of bulk AlN grown by a new solution growth method, Jpanese Journal of Applied Physics, Vol. 50, 2011, 120202.1-3.
• Noriyuki Kuwano, Hideto Miyake, Kazumasa Hiramatsu, Hiroshi Amano and Isam Akasaki, Evidence for moving of threading dislocations during the VPE growth in GaN thin layers, Physica Status Solidi, Vol. C8, No.5, 2011, 1487-1490.
• Noriyuki Kuwano, Atsushi Jinnnouchi, Sadanori Horikami, Naruyoshi Hirokado and Harini Sosiati, Effects of post-plating reflow on changes in crystal grain size of Sn-2 mass%Bi alloy plating with thermal cycling treatment,Materials Transactions JIM, Vol. 51, 2010, 1741-1746.
• Yoshiyuki Nagatomo, Ryo Muranaka, Hiromasa Hayashi, Yoshirou Kuromitsu and Noriyuki Kuwano, Fracture process of aluminum/aluminum nitride interfaces during thermal cycling, Materials Science Forum, Vol. 638/642, 2010, 3895-3900.

Conferences

• Noriyuki Kuwano, Introduction of potential uses of advanced SEM, presented at Workshop on the Collaboration of Application of Electron Microscopy at MJIIT UTM, Kuala Lumpur, Malaysia, May 9-10, 2012.
• Yuki Ryu, Takaaki Kuwahara, Noriyuki Kuwano, Takeshi Daio, Takuya Nomura, Hideto Miyake, Kazumasa Hiramatsu, Relationship between etch pits and threading dislocations in AlN grown on a sapphire substrate, presented at 4th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2012), Kasugai, Japan, March 4-8, 2012..
• T. Kuwahara, N. Kuwano, A. Kurisu, N. Okada and K. Tadatomo, Behavior of misfit dislocations in semipolar InGaN/GaN grown by MOVPE, presented at 9th International Conference on Nitride Semiconductors, (ICNS-9), Glasgow, UK, July 10-15, 2011.
• T. Kuwahara, T. Fujita, N. Kuwano, A. Kurisu, N. Okada and K. Tadatomo, TEM observation of microstructures in semipolar InGaN/GaN, presented at 30 th Electronic Materials Symposium (EMS-30), Shiga, Japan June 29- July 1, 2011.
• H. Miyake, Y. Shimahara, S. Ochiai, K. Hiramatsu, F. Fukuyo, T. Okada, H. Takaoka, H. Yoshida, T. Fujita, T. Kuwahara, N. Kuwano, 250 nm emission from Si-doped AlGaN and its quatum wells upon excitation by electron beam, presented at Asia-Pacific Workshop on Widegap Semiconductors (APWS-2011), Toba, Japan, May 22-26, 2011
• Takaaki Kuwahara, Tomoaki Fujita, Noriyuki Kuwano, Akihiro Kurisu, Narihito Okada and Kazuyuki Tadatomo, Behavior of dislocations near the interface in semipolar InGaN/GaN, presented at Asia-Pacific Workshop on Widegap Semiconductors (APWS-2011), Toba, Japan May 22-26, 2011
• Noriyuki Kuwano, Tomoaki Fujita, Takaaki Kuwahara, Hideto Miyake and kazumasa Hiramatsu, Behavior of Dislocations and growth Process of Low Al-Content AlGaN Layers on an AlN/sapphire Template,presented at Asia-Pacific Workshop on Widegap Semiconductors (APWS-2011), Toba, Japan, May 22-26, 2011
• Noriyuki Kuwano, Tomoaki Fujita, Takaaki Kuwahara, Hideto Miyake, Kazumasa Hiramatsu, Behavior of Threading Dislocations in VPE-Grown AlGaN, presented as an invited talk at 5th Congress of International Union of Microbeam Analysis Society (IUMAS-V), Seoul, Korea, May 22-27, 2011.
• N. Kuwano, S. Horikami and M. Maeda, TEM and SEM Analysis for Formation Mechanism of Tin Whiskers, presented as a Key-Note Talk at International Conference on the Advancement of Materials & Nanotechnology II (ICAMN-II), Kuala Lumpur, Malaysia, Nov.29- Dec. 1 2010.
• N. Kuwano, T. Fujita, T. Ezaki, R. Miyagawa, S. Ohuchi, H. Miyake and K. Hiramatsu, Possibility of climb-motion of threading dislocations in GaN thin layers during the VPE growth, presented as an invited talk at 29th Electronic Materials Symposium (EMS-29), Shuzenji, Japan, July 14-16, 2010.
• Noriyuki Kuwano, Tomoaki Fujita, Tetsuya Ezaki, Reina Miyagawa, Sumio Ohuchi, Hideto Miyake and Kazumasa Hiramatsu, Evidence for Movement of Threading Dislocations in GaN Thin Layers during the VPE Growth, presented  at The 3rd International Symposium on Growth of III-Nitrides (ISGN3), Montpellier, France, July 4-7, 2010.
• N. Kuwano, A. Jinnouchi and S. Horikami, In-situ SEM observation and TEM analysis of growth process of tin-whiskers formed by an external pressure, presented at Solid-Solid Phase Transformation in Inorganic Materials (PTM2010), Avignon, France, June 6-11, 2010.