Scanning Electron Microscopy & Electron Dispersive X-ray Spectroscopy
Our SEM (JSM-6010PLUS/LV) is a multifunctional general-purpose SEM with a new intuitive user interface making use of an operation screen and touch panel. Elemental analysis by EDS has been fully integrated. The low vacuum mode is included in the standard configuration, offering easy observation of non-conductive materials without pre-treatment.
SEM
- Magnifications up to x30000
- Equipped with Scattered Electron Image (SEI) and Back Scattered Electron (BSE) – Backscattered electrons are reflected after elastic interactions between the beam and the sample. Secondary electrons, however, originate from the atoms of the sample. They are a result of inelastic interactions between the electron beam and the sample.
- Also available for non-conductive materials (We do have a gold coater!)
EDS
- Point / area spectrum analysis
- Mapping analysis
Scanning Electron Microscope
Electron Dispersive X-ray Spectroscopy
