{"id":2700,"date":"2024-01-30T18:04:10","date_gmt":"2024-01-30T10:04:10","guid":{"rendered":"https:\/\/mjiit.utm.my\/tribology\/?page_id=2700"},"modified":"2024-05-03T09:52:41","modified_gmt":"2024-05-03T01:52:41","slug":"scanning-electron-microscope-electron-dispersion-x-ray-spectroscopy","status":"publish","type":"page","link":"https:\/\/mjiit.utm.my\/tribology\/scanning-electron-microscope-electron-dispersion-x-ray-spectroscopy\/","title":{"rendered":"SEM &amp; EDS"},"content":{"rendered":"<p>[et_pb_section fb_built=&#8221;1&#8243; _builder_version=&#8221;4.23&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_row _builder_version=&#8221;4.23&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;4_4&#8243; _builder_version=&#8221;4.23&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_text _builder_version=&#8221;4.25.0&#8243; _module_preset=&#8221;default&#8221; hover_enabled=&#8221;0&#8243; global_colors_info=&#8221;{}&#8221; sticky_enabled=&#8221;0&#8243;]<\/p>\n<h1><strong>Scanning Electron Microscopy &amp; Electron Dispersive X-ray Spectroscopy<\/strong><\/h1>\n<p>Our SEM (JSM-6010PLUS\/LV) is a<span>\u00a0multifunctional general-purpose SEM with a new intuitive user interface making use of an operation screen and touch panel. Elemental analysis by EDS has been fully integrated. The low vacuum mode is included in the standard configuration, offering easy observation of non-conductive materials without pre-treatment.<\/span><\/p>\n<p>&nbsp;<\/p>\n<p>[\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=&#8221;1_3,2_3&#8243; _builder_version=&#8221;4.23&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;1_3&#8243; _builder_version=&#8221;4.23&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_accordion _builder_version=&#8221;4.24.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_accordion_item title=&#8221;SEM&#8221; open=&#8221;on&#8221; _builder_version=&#8221;4.24.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;]<\/p>\n<ul>\n<li>Magnifications up to x30000<\/li>\n<li>Equipped with Scattered Electron Image (SEI) and Back Scattered Electron (BSE) &#8211; Backscattered electrons are reflected after elastic interactions between the beam and the sample. Secondary electrons, however, originate from the atoms of the sample. They are a result of inelastic interactions between the electron beam and the sample.<\/li>\n<li>Also available for non-conductive materials (We do have a gold coater!)<\/li>\n<\/ul>\n<p>[\/et_pb_accordion_item][\/et_pb_accordion][et_pb_accordion _builder_version=&#8221;4.24.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_accordion_item title=&#8221;EDS&#8221; open=&#8221;on&#8221; _builder_version=&#8221;4.24.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;]<\/p>\n<ul>\n<li>Point \/ area spectrum analysis<\/li>\n<li>Mapping analysis<\/li>\n<\/ul>\n<p>[\/et_pb_accordion_item][\/et_pb_accordion][\/et_pb_column][et_pb_column type=&#8221;2_3&#8243; _builder_version=&#8221;4.23&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_text _builder_version=&#8221;4.24.0&#8243; _module_preset=&#8221;default&#8221; text_orientation=&#8221;center&#8221; global_colors_info=&#8221;{}&#8221;]<\/p>\n<h2 style=\"text-align: center\"><strong>Scanning Electron Microscope<\/strong><\/h2>\n<p style=\"text-align: center\">\u00a0<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/1500-x-5-1a-300x225.jpeg\" width=\"300\" height=\"225\" alt=\"\" class=\"wp-image-2716 alignnone size-medium\" \/> <img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/DLC_cu-particles-xcoat-2500aa-300x225.jpg\" width=\"300\" height=\"225\" alt=\"\" class=\"wp-image-2717 alignnone size-medium\" \/><\/p>\n<h2 style=\"text-align: center\"><strong>Electron Dispersive X-ray Spectroscopy<\/strong><\/h2>\n<p style=\"text-align: center\"><strong>\u00a0<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/eds-1-210x300.jpg\" width=\"210\" height=\"300\" alt=\"\" class=\"wp-image-2719 alignnone size-medium\" srcset=\"https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/eds-1-210x300.jpg 210w, https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/eds-1.jpg 436w\" sizes=\"(max-width: 210px) 100vw, 210px\" \/> <img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/eds-2-201x300.jpg\" width=\"201\" height=\"300\" alt=\"\" class=\"wp-image-2720 alignnone size-medium\" srcset=\"https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/eds-2-201x300.jpg 201w, https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/eds-2.jpg 420w\" sizes=\"(max-width: 201px) 100vw, 201px\" \/><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/mjiit.utm.my\/tribology\/wp-content\/uploads\/sites\/134\/2024\/01\/Ni-dlc_Cu-x2500-Cu_C-1-300x230.jpg\" width=\"387\" height=\"297\" alt=\"\" class=\"wp-image-2718 alignnone size-medium\" \/><\/strong><\/p>\n<p>&nbsp;<\/p>\n<p>[\/et_pb_text][\/et_pb_column][\/et_pb_row][\/et_pb_section]<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Scanning Electron Microscopy &amp; Electron Dispersive X-ray Spectroscopy Our SEM (JSM-6010PLUS\/LV) is a\u00a0multifunctional general-purpose SEM with a new intuitive user interface making use of an operation screen and touch panel. Elemental analysis by EDS has been fully integrated. The low vacuum mode is included in the standard configuration, offering easy observation of non-conductive materials without [&hellip;]<\/p>\n","protected":false},"author":159,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"_et_pb_use_builder":"on","_et_pb_old_content":"","_et_gb_content_width":"","ngg_post_thumbnail":0,"footnotes":""},"class_list":["post-2700","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/pages\/2700","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/users\/159"}],"replies":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/comments?post=2700"}],"version-history":[{"count":12,"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/pages\/2700\/revisions"}],"predecessor-version":[{"id":2953,"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/pages\/2700\/revisions\/2953"}],"wp:attachment":[{"href":"https:\/\/mjiit.utm.my\/tribology\/wp-json\/wp\/v2\/media?parent=2700"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}