{"id":342,"date":"2016-10-10T11:25:15","date_gmt":"2016-10-10T03:25:15","guid":{"rendered":"http:\/\/mjiit.utm.my\/microscopy-lab\/?page_id=342"},"modified":"2021-01-31T18:34:43","modified_gmt":"2021-01-31T10:34:43","slug":"leica-em-txp","status":"publish","type":"page","link":"https:\/\/mjiit.utm.my\/microscopy-lab\/leica-em-txp\/","title":{"rendered":"LEICA EM TXP"},"content":{"rendered":"<h1><\/h1>\n<h2><a href=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/leica.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-615\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/leica-1024x682.jpg\" alt=\"leica\" width=\"600\" height=\"400\" srcset=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/leica-1024x682.jpg 1024w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/leica-300x200.jpg 300w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/leica-768x512.jpg 768w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/leica.jpg 1280w\" sizes=\"(max-width: 600px) 100vw, 600px\" \/><\/a><\/h2>\n<h2><strong>LEICA EM TXP<\/strong><\/h2>\n<div><span style=\"font-size: 16px\"><strong>Brand<\/strong><\/span> :<span style=\"font-size: 16px\"><strong> LEICA MICROSYSTEM<\/strong><\/span><\/div>\n<div><\/div>\n<div>\n<table style=\"height: 252px;width: 575px\">\n<tbody>\n<tr style=\"height: 24px\">\n<td style=\"width: 156px;border-color: #050505;background-color: #76dee3;height: 24px\">\u00a0<strong><span style=\"font-size: 16px\">Details<\/span><\/strong><\/td>\n<td style=\"width: 431px;border-color: #050505;background-color: #76dee3;height: 24px\"><\/td>\n<\/tr>\n<tr style=\"height: 285px\">\n<td style=\"width: 156px;height: 285px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Details of Instrument<\/span><\/td>\n<td style=\"width: 431px;text-align: justify;height: 285px\"><span style=\"font-family: arial, helvetica, sans-serif;font-size: 16px\">The Leica\u00a0EM\u00a0TXP is a\u00a0target preparation device\u00a0for\u00a0milling, sawing, grinding, and\u00a0polishing\u00a0samples prior to examination by\u00a0SEM,\u00a0TEM, and\u00a0LM\u00a0techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.With the specimen pivot arm the sample can be observed directly at an angle between 0\u00b0 and 60\u00b0, or 90\u00b0 to the front face for distance determination with an\u00a0eyepiece graticule.<\/span><\/td>\n<\/tr>\n<tr style=\"height: 45px\">\n<td style=\"width: 156px;height: 45px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Operation\u00a0Hours<\/span><\/td>\n<td style=\"width: 431px;height: 45px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">9.00 a.m. \u2013 4.30 p.m.<\/span><\/td>\n<\/tr>\n<tr style=\"height: 48px\">\n<td style=\"width: 156px;height: 48px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Status<\/span><\/td>\n<td style=\"width: 431px;height: 48px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Available for Booking<\/span><\/td>\n<\/tr>\n<tr style=\"height: 216px\">\n<td style=\"width: 156px;height: 216px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">P.I.C<\/span><\/td>\n<td style=\"width: 431px;height: 216px\">\n<div><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">-(For booking)<\/span><\/div>\n<div><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">microscopylaboratorymjiit@gmail.com<\/span><\/div>\n<div><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">03-2203 1527<\/span><\/div>\n<div><\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>LEICA EM TXP Brand : LEICA MICROSYSTEM \u00a0Details Details of Instrument The Leica\u00a0EM\u00a0TXP is a\u00a0target preparation device\u00a0for\u00a0milling, sawing, grinding, and\u00a0polishing\u00a0samples prior to examination by\u00a0SEM,\u00a0TEM, and\u00a0LM\u00a0techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.With the specimen pivot arm the sample can be observed directly at an angle between 0\u00b0 and 60\u00b0, or [&hellip;]<\/p>\n","protected":false},"author":122,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"class_list":["post-342","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/342","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/users\/122"}],"replies":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/comments?post=342"}],"version-history":[{"count":24,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/342\/revisions"}],"predecessor-version":[{"id":3010,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/342\/revisions\/3010"}],"wp:attachment":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/media?parent=342"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}