{"id":330,"date":"2016-10-10T11:01:29","date_gmt":"2016-10-10T03:01:29","guid":{"rendered":"http:\/\/mjiit.utm.my\/microscopy-lab\/?page_id=330"},"modified":"2021-01-31T18:37:20","modified_gmt":"2021-01-31T10:37:20","slug":"cross-section-polisher","status":"publish","type":"page","link":"https:\/\/mjiit.utm.my\/microscopy-lab\/cross-section-polisher\/","title":{"rendered":"Cross-Section Polisher"},"content":{"rendered":"

<\/h1>\n

\"cross-section-polisher__\"<\/a><\/h1>\n

CROSS-SECTION POLISHER<\/strong><\/h2>\n
Brand : JEOL<\/strong><\/div>\n
Model : IB-19510CP<\/strong><\/div>\n
\n\n\n\n\n\n\n\n
\u00a0Details<\/span><\/strong><\/td>\n<\/td>\n<\/tr>\n
\u00a0Details of Instrument<\/span><\/td>\nJEOL\u2019s Cross Section Polisher produces pristine cross sections of samples \u2013 hard, soft, or composites \u2013 without smearing, crumbling, distorting, or contaminating them in any way. There is no precedent for a cross sectioning instrument of this type for SEM, EPMA, and SAM sample preparation. The ability to create perfect cross sections of <\/span>paper, shale, yeast, latex beads, coatings, and wire bonds, or to create a mirrored surface on soft materials such as gold, polymers, ceramics, and glass has greatly enhanced research and analysis.<\/span><\/td>\n<\/tr>\n
\u00a0Operation\u00a0<\/span>Hours<\/span><\/td>\n\u00a09.00 a.m. \u2013 4.30 p.m.<\/span><\/td>\n<\/tr>\n
\u00a0Status<\/span><\/td>\n\u00a0Available for Booking<\/span><\/td>\n<\/tr>\n
P.I.C<\/span><\/td>\n\n
\n
-(For Booking)<\/span><\/div>\n
microscopylaboratorymjiit@gmail.com<\/span><\/div>\n
03-2203 1527<\/span><\/div>\n<\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

CROSS-SECTION POLISHER Brand : JEOL Model : IB-19510CP \u00a0Details \u00a0Details of Instrument JEOL\u2019s Cross Section Polisher produces pristine cross sections of samples \u2013 hard, soft, or composites \u2013 without smearing, crumbling, distorting, or contaminating them in any way. There is no precedent for a cross sectioning instrument of this type for SEM, EPMA, and SAM […]<\/p>\n","protected":false},"author":122,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"class_list":["post-330","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/330","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/users\/122"}],"replies":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/comments?post=330"}],"version-history":[{"count":24,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/330\/revisions"}],"predecessor-version":[{"id":3014,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/330\/revisions\/3014"}],"wp:attachment":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/media?parent=330"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}