{"id":299,"date":"2016-10-04T12:28:18","date_gmt":"2016-10-04T04:28:18","guid":{"rendered":"http:\/\/mjiit.utm.my\/microscopy-lab\/?page_id=299"},"modified":"2021-01-31T18:44:45","modified_gmt":"2021-01-31T10:44:45","slug":"dualbeam-scanning-electron-microscopefocused-ion-beam-fib-sem","status":"publish","type":"page","link":"https:\/\/mjiit.utm.my\/microscopy-lab\/dualbeam-scanning-electron-microscopefocused-ion-beam-fib-sem\/","title":{"rendered":"Dualbeam Scanning Electron Microscope\/Focused Ion Beam (FIB-SEM)"},"content":{"rendered":"<h1><span style=\"font-family: arial, helvetica, sans-serif\">\u00a0<a href=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM2_.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-583\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM2_.jpg\" alt=\"fibsem2_\" width=\"600\" height=\"400\" srcset=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM2_.jpg 1280w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM2_-300x200.jpg 300w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM2_-768x512.jpg 768w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM2_-1024x682.jpg 1024w\" sizes=\"(max-width: 600px) 100vw, 600px\" \/><\/a><\/span><\/h1>\n<p><span style=\"font-family: arial, helvetica, sans-serif\"><a href=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM7_.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-587\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM7_-300x200.jpg\" alt=\"fibsem7_\" width=\"280\" height=\"187\" srcset=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM7_-300x200.jpg 300w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM7_-768x512.jpg 768w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM7_-1024x682.jpg 1024w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FIBSEM7_.jpg 1280w\" sizes=\"(max-width: 280px) 100vw, 280px\" \/><\/a>\u00a0 \u00a0 \u00a0<a href=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4638_.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-586\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4638_-300x200.jpg\" alt=\"dsc_4638_\" width=\"280\" height=\"187\" srcset=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4638_-300x200.jpg 300w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4638_-768x512.jpg 768w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4638_-1024x682.jpg 1024w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4638_.jpg 1280w\" sizes=\"(max-width: 280px) 100vw, 280px\" \/><\/a><\/span><\/p>\n<h1><span style=\"font-family: arial, helvetica, sans-serif\">\u00a0<\/span><\/h1>\n<h2 style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\"><strong>DUALBEAM SCANNING ELECTRON MICROSCOPE\/FOCUSED ION BEAM (FIB-SEM)\u00a0<\/strong><\/span><\/h2>\n<div style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\"><span style=\"font-size: 16px\">Brand<\/span> :<span style=\"font-size: 16px\"> FEI<\/span><\/span><\/div>\n<div style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\"><span style=\"font-size: 16px\">Model<\/span> :<span style=\"font-size: 16px\"> HELIOS NANOLAB G3 UC<\/span><\/span><\/div>\n<div style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\">\u00a0<\/span><\/div>\n<div style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\">\u00a0<\/span><\/div>\n<table style=\"height: 507px;width: 58.9916%\">\n<tbody>\n<tr style=\"height: 24px\">\n<td style=\"width: 24.4037%;background-color: #68e7ed;border-color: #030303;height: 24px\"><span style=\"font-size: 14px;font-family: arial, helvetica, sans-serif\">\u00a0<strong>Details<\/strong><\/span><\/td>\n<td style=\"width: 111.679%;background-color: #68e7ed;border-color: #030303;height: 24px\"><span style=\"font-size: 14px;font-family: arial, helvetica, sans-serif\">\u00a0<\/span><\/td>\n<\/tr>\n<tr style=\"height: 174px\">\n<td style=\"width: 24.4037%;height: 174px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Details of Instrument<\/span><\/td>\n<td style=\"width: 111.679%;text-align: justify;height: 174px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">The\u00a0Helios NanoLab G3 UC DualBeam SEM\/FIB accelerates discovery by revealing the finest nanoscale details in 2D and 3D images with clearest contrast, creating complex functional nanodevices over millimeters, as well as preparing the thinnest and highest quality samples to access the most accurate atomic information. It is especially well-suited for a wide range of materials, including those that are soft or delicate, such as metals, polymers, nanotubes, particles, or ceramics.<\/span><\/td>\n<\/tr>\n<tr style=\"height: 49px\">\n<td style=\"width: 24.4037%;height: 49px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Service Charge<\/span><\/td>\n<td style=\"width: 111.679%;height: 49px\">FIB-FESEM Fee per sample :-<\/p>\n<ul style=\"list-style-type: square\">\n<li>Student\/Staff MJIIT <strong>(RM240)<\/strong><\/li>\n<li>Student\/Staff UTM <strong>(RM300)<\/strong><\/li>\n<li>Student\/Staff Other University <strong>(RM360)<\/strong><\/li>\n<li>Industry <strong>(RM600)<\/strong><\/li>\n<\/ul>\n<p>EDS\/EBSD Fee per sample :-<\/p>\n<ul style=\"list-style-type: square\">\n<li>Student\/Staff MJIIT <strong>(RM80)<\/strong><\/li>\n<li>Student\/Staff UTM <strong>(RM100)<\/strong><\/li>\n<li>Student\/Staff Other University <strong>(RM120)<\/strong><\/li>\n<li>Industry <strong>(RM200)<\/strong><\/li>\n<\/ul>\n<p>With FIB Fee per sample :-<\/p>\n<ul style=\"list-style-type: square\">\n<li>Student\/Staff MJIIT <strong>(RM400)<\/strong><\/li>\n<li>Student\/Staff UTM <strong>(RM500)<\/strong><\/li>\n<li>Student\/Staff Other University <strong>(RM600)<\/strong><\/li>\n<li>Industry <strong>(RM1000)<\/strong><\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<tr style=\"height: 47px\">\n<td style=\"width: 24.4037%;height: 47px\"><span style=\"font-family: arial, helvetica, sans-serif;font-size: 16px\">Operation Hours<\/span><\/td>\n<td style=\"width: 111.679%;height: 47px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">9.00 a.m. \u2013 4.30 p.m.<\/span><\/td>\n<\/tr>\n<tr style=\"height: 56px\">\n<td style=\"width: 24.4037%;height: 56px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Status<\/span><\/td>\n<td style=\"width: 111.679%;height: 56px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Available for Booking<\/span><\/td>\n<\/tr>\n<tr style=\"height: 171px\">\n<td style=\"width: 24.4037%;height: 121px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">P.I.C<\/span><\/td>\n<td style=\"width: 111.679%;height: 121px\">\n<div><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">-(For booking)<\/span><\/div>\n<div><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">microscopylaboratorymjiit@gmail.com<\/span><\/div>\n<div><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">03-2203 1527<\/span><\/div>\n<div><\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<div><span style=\"font-family: arial, helvetica, sans-serif\">\u00a0<\/span><\/div>\n","protected":false},"excerpt":{"rendered":"<p>\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 DUALBEAM SCANNING ELECTRON MICROSCOPE\/FOCUSED ION BEAM (FIB-SEM)\u00a0 Brand : FEI Model : HELIOS NANOLAB G3 UC \u00a0 \u00a0 \u00a0Details \u00a0 Details of Instrument The\u00a0Helios NanoLab G3 UC DualBeam SEM\/FIB accelerates discovery by revealing the finest nanoscale details in 2D and 3D images with clearest contrast, creating complex functional nanodevices over [&hellip;]<\/p>\n","protected":false},"author":122,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"class_list":["post-299","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/299","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/users\/122"}],"replies":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/comments?post=299"}],"version-history":[{"count":51,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/299\/revisions"}],"predecessor-version":[{"id":3028,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/299\/revisions\/3028"}],"wp:attachment":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/media?parent=299"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}