{"id":285,"date":"2016-09-28T10:25:36","date_gmt":"2016-09-28T02:25:36","guid":{"rendered":"http:\/\/mjiit.utm.my\/microscopy-lab\/?page_id=285"},"modified":"2021-01-31T18:44:25","modified_gmt":"2021-01-31T10:44:25","slug":"field-emission-scanning-electron-microscope-fesem","status":"publish","type":"page","link":"https:\/\/mjiit.utm.my\/microscopy-lab\/field-emission-scanning-electron-microscope-fesem\/","title":{"rendered":"Field-Emission Scanning Electron Microscope (FESEM)"},"content":{"rendered":"<h1 style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\"><strong><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-920\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/09\/FESEM2_-300x200.jpg\" alt=\"\" width=\"578\" height=\"385\" srcset=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/09\/FESEM2_-300x200.jpg 300w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/09\/FESEM2_-768x512.jpg 768w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/09\/FESEM2_-1024x682.jpg 1024w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/09\/FESEM2_.jpg 1280w\" sizes=\"(max-width: 578px) 100vw, 578px\" \/>\u00a0<\/strong><\/span><\/h1>\n<p><span style=\"font-family: arial, helvetica, sans-serif\"><a href=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4626_Easy-Resize.com_.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-589\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/DSC_4626_Easy-Resize.com_-300x200.jpg\" alt=\"dsc_4626_easy-resize-com\" width=\"280\" height=\"187\" \/><\/a>\u00a0 \u00a0\u00a0<img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-592\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FESEM4_-300x200.jpg\" alt=\"fesem4_\" width=\"280\" height=\"187\" srcset=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FESEM4_-300x200.jpg 300w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FESEM4_-768x512.jpg 768w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FESEM4_-1024x682.jpg 1024w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2016\/10\/FESEM4_.jpg 1280w\" sizes=\"(max-width: 280px) 100vw, 280px\" \/><\/span><\/p>\n<h2 style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\"><strong>FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)<\/strong><\/span><\/h2>\n<div style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\"><span style=\"font-size: 16px\">Brand<\/span> :<span style=\"font-size: 16px\">\u00a0JEOL<\/span><\/span><\/div>\n<div style=\"text-align: left\"><span style=\"font-family: arial, helvetica, sans-serif\"><span style=\"font-size: 16px\">Model<\/span> :<span style=\"font-size: 16px\">\u00a0JSM-7800F<\/span><\/span><\/div>\n<div><span style=\"font-family: arial, helvetica, sans-serif\">\u00a0<\/span><\/div>\n<table style=\"height: 381px;width: 63.3405%\">\n<tbody>\n<tr style=\"height: 24px\">\n<td style=\"width: 30.8824%;background-color: #7ff0e8;height: 24px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0<strong>Details<\/strong><\/span><\/td>\n<td style=\"width: 117.069%;background-color: #7ff0e8;height: 24px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0<\/span><\/td>\n<\/tr>\n<tr style=\"height: 54.5667px\">\n<td style=\"width: 30.8824%;height: 54px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0Details of Instrument<\/span><\/td>\n<td style=\"width: 117.069%;text-align: justify;height: 54px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">FE-SEM is an essential tool to observe the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution, collect large area EBSD maps at low magnifications without distortion, perform low kV imaging and analysis of highly magnetic samples and image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector.<\/span><\/td>\n<\/tr>\n<tr style=\"height: 45px\">\n<td style=\"width: 30.8824%;height: 45px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">Sample Image<\/span><\/td>\n<td style=\"width: 117.069%;text-align: justify;height: 45px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-medium wp-image-1326\" src=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2017\/08\/fesem-300x223.png\" alt=\"\" width=\"300\" height=\"223\" srcset=\"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2017\/08\/fesem-300x223.png 300w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2017\/08\/fesem-768x570.png 768w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2017\/08\/fesem-1024x760.png 1024w, https:\/\/mjiit.utm.my\/microscopy-lab\/wp-content\/uploads\/sites\/72\/2017\/08\/fesem.png 1250w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><\/span><\/td>\n<\/tr>\n<tr style=\"height: 10px\">\n<td style=\"width: 30.8824%;height: 10px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0Service Charge<\/span><\/td>\n<td style=\"width: 117.069%;height: 10px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0<\/span>FESEM Fee per sample :-<\/p>\n<ul style=\"list-style-type: square\">\n<li>Student\/Staff MJIIT <strong>(RM200)<\/strong><\/li>\n<li>Student\/Staff UTM <strong>(RM250)<\/strong><\/li>\n<li>Student\/Staff Other University <strong>(RM300)<\/strong><\/li>\n<li>Industry <strong>(RM500)<\/strong><\/li>\n<\/ul>\n<p>EDS\/EBSD\/EDX Fee per sample :-<\/p>\n<ul style=\"list-style-type: square\">\n<li>Students\/Staff MJIIT <strong>(RM80)<\/strong><\/li>\n<li>Student\/Staff UTM <strong>(RM100)<\/strong><\/li>\n<li>Student\/Staff Other University <strong>(RM120)<\/strong><\/li>\n<li>Industry <strong>(RM200)<\/strong><\/li>\n<\/ul>\n<p>&nbsp;<\/td>\n<\/tr>\n<tr style=\"height: 62px\">\n<td style=\"width: 30.8824%;height: 62px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0Operation\u00a0Hours<\/span><\/td>\n<td style=\"width: 117.069%;height: 62px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a09.00 a.m. \u2013 4.30 p.m.<\/span><\/td>\n<\/tr>\n<tr style=\"height: 52px\">\n<td style=\"width: 30.8824%;height: 52px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0Status<\/span><\/td>\n<td style=\"width: 117.069%;height: 52px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">\u00a0Available for Booking<\/span><\/td>\n<\/tr>\n<tr style=\"height: 240px\">\n<td style=\"width: 30.8824%;height: 110px\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">P.I.C<\/span><\/td>\n<td style=\"width: 117.069%;height: 110px\">\n<div style=\"text-align: left\">\n<div style=\"text-align: left\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">-(For Booking)<\/span><\/div>\n<div style=\"text-align: left\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">microscopylaboratorymjiit@gmail.com<\/span><\/div>\n<div style=\"text-align: left\"><span style=\"font-size: 16px;font-family: arial, helvetica, sans-serif\">03-2203 1527<\/span><\/div>\n<\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u00a0 \u00a0 \u00a0\u00a0 FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM) Brand :\u00a0JEOL Model :\u00a0JSM-7800F \u00a0 \u00a0Details \u00a0 \u00a0Details of Instrument FE-SEM is an essential tool to observe the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution, collect large area EBSD maps at low magnifications without distortion, perform low kV imaging and analysis of [&hellip;]<\/p>\n","protected":false},"author":122,"featured_media":276,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"class_list":["post-285","page","type-page","status-publish","has-post-thumbnail","hentry"],"_links":{"self":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/285","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/users\/122"}],"replies":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/comments?post=285"}],"version-history":[{"count":68,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/285\/revisions"}],"predecessor-version":[{"id":3026,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/285\/revisions\/3026"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/media\/276"}],"wp:attachment":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/media?parent=285"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}