{"id":1360,"date":"2017-08-02T11:58:05","date_gmt":"2017-08-02T03:58:05","guid":{"rendered":"http:\/\/mjiit.utm.my\/microscopy-lab\/?page_id=1360"},"modified":"2021-01-31T18:41:46","modified_gmt":"2021-01-31T10:41:46","slug":"atomic-force-microscope","status":"publish","type":"page","link":"https:\/\/mjiit.utm.my\/microscopy-lab\/atomic-force-microscope\/","title":{"rendered":"Atomic Force Microscope"},"content":{"rendered":"

\u00a0<\/strong><\/span><\/h1>\n

\u00a0 \u00a0\u00a0\"\"\u00a0\"\"<\/span><\/p>\n

ATOMIC FORCE MICROSCOPY (AFM)<\/strong><\/span><\/h2>\n
Brand<\/span> :\u00a0Bruker<\/span><\/span><\/div>\n
Model<\/span> : Multimode 8<\/span><\/span><\/div>\n
\u00a0<\/span><\/div>\n\n\n\n\n\n\n\n\n\n
\u00a0Details<\/strong><\/span><\/td>\n\u00a0<\/span><\/td>\n<\/tr>\n
\u00a0Details of Instrument<\/span><\/td>\nAtomic force microscopy uses imaging technique with high resolution for measuring the surface topography by scanning with small probe with sharp tip across the sample. Characterization of electrical, magnetic, and mechanical properties can be done into nanoscale level using this instrument.\u00a0<\/span><\/td>\n<\/tr>\n
Sample Image<\/span><\/td>\n<\/td>\n<\/tr>\n
\u00a0Service Charge<\/span><\/td>\n\u00a0<\/span>Atomic Force Microscope Fee per hour :-<\/p>\n
    \n
  • Student\/Staff MJIIT (RM80)<\/strong><\/li>\n
  • Student\/Staff UTM (RM150)<\/strong><\/li>\n
  • Student\/Staff Other University (RM200)<\/strong><\/li>\n
  • Industry (RM300)<\/strong><\/li>\n<\/ul>\n<\/td>\n<\/tr>\n
\u00a0Operation\u00a0Hours<\/span><\/td>\n\u00a09.00 a.m. \u2013 4.30 p.m.<\/span><\/td>\n<\/tr>\n
\u00a0Status<\/span><\/td>\n\u00a0Available for Booking<\/span><\/td>\n<\/tr>\n
P.I.C<\/span><\/td>\n\n
\n
-(For Booking)<\/span><\/div>\n
microscopylaboratorymjiit@gmail.com<\/span><\/div>\n
03-2203 1527<\/span><\/div>\n<\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

\u00a0 \u00a0 \u00a0\u00a0\u00a0 ATOMIC FORCE MICROSCOPY (AFM) Brand :\u00a0Bruker Model : Multimode 8 \u00a0 \u00a0Details \u00a0 \u00a0Details of Instrument Atomic force microscopy uses imaging technique with high resolution for measuring the surface topography by scanning with small probe with sharp tip across the sample. Characterization of electrical, magnetic, and mechanical properties can be done into […]<\/p>\n","protected":false},"author":137,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"class_list":["post-1360","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/1360","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/users\/137"}],"replies":[{"embeddable":true,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/comments?post=1360"}],"version-history":[{"count":15,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/1360\/revisions"}],"predecessor-version":[{"id":3021,"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/pages\/1360\/revisions\/3021"}],"wp:attachment":[{"href":"https:\/\/mjiit.utm.my\/microscopy-lab\/wp-json\/wp\/v2\/media?parent=1360"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}