LEICA EM TXP

leica

LEICA EM TXP

Brand : LEICA MICROSYSTEM
 Details
Details of Instrument The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.
Service Charge Click here
Operation Hours 9.00 a.m. – 4.30 p.m.
Status Available for Booking
P.I.C
-(For booking)
microscopylaboratorymjiit@gmail.com
03-2203 1527
 
 
 
-Ahmad Rafiqan Nayan (Application Engineer)
 ahmad.rafiqan@crest-group.net
 014-236 2179
Get the price quotation Click here