Field-Emission Scanning Electron Microscope (FESEM)

 

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FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)

Brand : JEOL
Model : JSM-7800F
 
 Details  
 Details of Instrument FE-SEM is an essential tool to observe the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution, collect large area EBSD maps at low magnifications without distortion, perform low kV imaging and analysis of highly magnetic samples and image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector.
Sample Image
 Service Charge  Click here
 Operation Hours  9.00 a.m. – 4.30 p.m.
 Status  Available for Booking
P.I.C
-(For Booking)
microscopylaboratorymjiit@gmail.com
03-2203 1527
 
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