Dualbeam Scanning Electron Microscope/Focused Ion Beam (FIB-SEM)

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DUALBEAM SCANNING ELECTRON MICROSCOPE/FOCUSED ION BEAM (FIB-SEM) 

Brand : FEI
Model : HELIOS NANOLAB G3 UC
 
 
 Details  
Details of Instrument The Helios NanoLab G3 UC DualBeam SEM/FIB accelerates discovery by revealing the finest nanoscale details in 2D and 3D images with clearest contrast, creating complex functional nanodevices over millimeters, as well as preparing the thinnest and highest quality samples to access the most accurate atomic information. It is especially well-suited for a wide range of materials, including those that are soft or delicate, such as metals, polymers, nanotubes, particles, or ceramics.
Service Charge Click here
Operation Hours 9.00 a.m. – 4.30 p.m.
Status Available for Booking
P.I.C
-(For booking)
microscopylaboratorymjiit@gmail.com
03-2203 1527
 
-Ahmad Rafiqan Nayan (Application Engineer)
ahmad.rafiqan@crest-group.net
 014-236 2179
Get the price quotation Click here