ATOMIC FORCE MICROSCOPY (AFM)
Brand : Bruker
Model :
| Details | |
| Details of Instrument | Atomic force microscopy uses imaging technique with high resolution for measuring the surface topography by scanning with small probe wwith sharp tip across the sample. Characterization of electrical, magnetic, and mechanical properties can be done into nanoscale level using this instrument. |
| Sample Image | |
| Service Charge | Click here |
| Operation Hours | 9.00 a.m. – 4.30 p.m. |
| Status | Available for Booking |
| P.I.C |
-(For Booking)
microscopylaboratorymjiit@gmail.com
03-2203 1527
-Jesbains Kaur (Application Engineer)
jesbains@jeolmal.com
017-872 5633
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| Get the price quotation | Click here |