Atomic Force Microscope

 

     

ATOMIC FORCE MICROSCOPY (AFM)

Brand : Bruker
Model : 
 
 Details  
 Details of Instrument Atomic force microscopy uses imaging technique with high resolution for measuring the surface topography by scanning with small probe wwith sharp tip across the sample. Characterization of electrical, magnetic, and mechanical properties can be done into nanoscale level using this instrument. 
Sample Image
 Service Charge  Click here
 Operation Hours  9.00 a.m. – 4.30 p.m.
 Status  Available for Booking
P.I.C
-(For Booking)
microscopylaboratorymjiit@gmail.com
03-2203 1527
 
-Jesbains Kaur (Application Engineer)
jesbains@jeolmal.com
017-872 5633
Get the price quotation Click here